Cp is a measure of process capability that compares the specification width *(USL – LSL) *to the total process variation *(6σ) *for a given process or product parameter. The higher the Cp value, the more potential a process has to fit inside specification limits. Unlike Cpk, Cp does not take the process position (mean) into account, so a high Cp does not necessary equate to a capable process. The equation for Cp is

Note that for a perfectly centered process, Cp = Cpk.

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